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Hokkaido University Collection of Scholarly and Academic Papers >
Institute of Low Temperature Science >
低温科学 = Low Temperature Science >
第33輯 >
走査型電子顕微鏡による氷の表面の観察 Ⅱ : 冷却に伴う試料の汚染
| Title: | 走査型電子顕微鏡による氷の表面の観察 Ⅱ : 冷却に伴う試料の汚染 |
| Other Titles: | Observation of Ice Surfaces by a Scanning Electron MicroscopeⅡ:Contamination on Ice Crystal Surface |
| Authors: | 鈴木, 重尚1 Browse this author |
| Authors(alt): | SUZUKI, Shigenao1 |
| Issue Date: | 30-Mar-1976 |
| Publisher: | 北海道大学低温科学研究所 |
| Journal Title: | 低温科學. 物理篇 |
| Journal Title(alt): | Low temperature science. Series A, Physical sciences |
| Volume: | 33 |
| Start Page: | 1 |
| End Page: | 9 |
| Type: | bulletin (article) |
| URI: | http://hdl.handle.net/2115/18269 |
| Appears in Collections: | 低温科学 = Low Temperature Science > 第33輯
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