2024-03-28T23:51:30Zhttps://eprints.lib.hokudai.ac.jp/dspace-oai/requestoai:eprints.lib.hokudai.ac.jp:2115/419912019-03-18T09:57:13Zhdl_2115_40364hdl_2115_40231hdl_2115_139容量過渡解析によるAl2O3/native oxide/InP MIS構造の評価Characterization of Interface Properties of Al2O3/native oxide/InP MIS Structure by Capacitance Transient Analysis増田, 宏Masuda, Hiroshi何, 力He, Li長谷川, 英機Hasegawa, Hideki沢田, 孝幸Sawada, Takayuki大野, 英男Ohno, Hideoopen access500北海道大学Hokkaido University1986-07-31jpndepartmental bulletin paperVoRhttp://hdl.handle.net/2115/419910385-602XAN00230223北海道大學工學部研究報告Bulletin of the Faculty of Engineering, Hokkaido University1328999https://eprints.lib.hokudai.ac.jp/dspace/bitstream/2115/41991/1/132_89-100.pdfapplication/pdf748.12 KB1986-07-31