2024-03-28T10:36:03Zhttps://eprints.lib.hokudai.ac.jp/dspace-oai/requestoai:eprints.lib.hokudai.ac.jp:2115/506012022-11-17T02:08:08Zhdl_2115_20053hdl_2115_145X-ray absorption spectroscopy and x-ray magnetic circular dichroism of epitaxially grown Heusler alloy Co2MnSi ultrathin films facing a MgO barrierSaito, ToshiakiKatayama, ToshikazuIshikawa, Takayuki1000010322835Yamamoto, MasafumiAsakura, DaisukeKoide, Tsuneharuopen accessCopyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in Appl. Phys. Lett. 91, 262502 and may be found at https://dx.doi.org/10.1063/1.2824856427We element specifically studied the electronic and magnetic states of epitaxially grown full-Heusler alloy Co2MnSi (CMS) 1.1 nm (4 ML) thick ultrathin films facing an epitaxial MgO(001) tunnel barrier by means of x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD). In situ reflection high-energy electron-diffraction observations indicated that the CMS films grew into the L21 structure. The observed XAS and XMCD spectra revealed that the CMS ultrathin film was not oxidized. The ratio of Mn and Co spin magnetic moments obtained by applying the sum rules was about 2.7, close to a theoretical value of 2.8 for CMS with the L21 structure.American Institute of Physics2007-12-26engjournal articleVoRhttp://hdl.handle.net/2115/50601https://doi.org/10.1063/1.28248560003-6951Applied Physics Letters9126262502https://eprints.lib.hokudai.ac.jp/dspace/bitstream/2115/50601/3/APL91_262502.pdfapplication/pdf315.27 KB2007-12-26