2024-03-29T07:09:22Zhttps://eprints.lib.hokudai.ac.jp/dspace-oai/requestoai:eprints.lib.hokudai.ac.jp:2115/777392022-11-17T02:08:08Zhdl_2115_52005hdl_2115_52004In situ X-ray photoelectron spectroscopy using a conventional Al-K alpha source and an environmental cell for liquid samples and solid-liquid interfacesEndo, RaimuWatanabe, DaisukeShimomura, MasaruMasuda, Takuyaopen accessThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in citation of published article and may be found at https://aip.scitation.org/doi/10.1063/1.5093351.Chemical compounds and componentsX-ray photoelectron spectroscopyElectrochemistryChemical elementsMaterials analysisPhotoelectron spectraIonic liquids430X-ray photoelectron spectroscopy (XPS), which intrinsically requires vacuum, was used to characterize chemical species in a liquid using laboratory XPS apparatus equipped with a conventional Al-K alpha source and an environmental cell with an ultra-thin silicon nitride membrane as a quasi-transparent window for the transmission of X-rays and photoelectrons. Aqueous solutions of cesium chloride at different concentrations were encapsulated in the cells, and the membrane in contact with the solution was irradiated with X-rays to collect the photoelectrons emitted from the chemical species in a liquid through the membrane. Cs 4d photoelectron peaks were observed, and the peak intensity increased proportionally with the concentration. Thus, the quantitative analysis of solution species by this method is demonstrated. Published under license by AIP Publishing.American Institute of Physics (AIP)2019-04-29engjournal articleVoRhttp://hdl.handle.net/2115/77739https://doi.org/10.1063/1.50933510003-6951AA00543431Applied physics letters11417173702https://eprints.lib.hokudai.ac.jp/dspace/bitstream/2115/77739/1/1.5093351.pdfapplication/pdf1.12 MB2019-04-29