2024-03-28T15:28:52Zhttps://eprints.lib.hokudai.ac.jp/dspace-oai/requestoai:eprints.lib.hokudai.ac.jp:2115/454322022-11-17T02:08:08Zhdl_2115_20045hdl_2115_139Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubesKamimura, OsamuKawahara, KotaDoi, TakahisaDobashi, TakashiAbe, TakashiGohara, Kazutoshicarbon nanotubeselectron diffractionelectron microscopyimage reconstruction540Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for radiation-sensitive materials. Fine, homogeneous, and isolated multiwall carbon nanotubes (MWCNTs) were used as specimens. To avoid lens aberrations, the diffraction patterns were recorded without a postspecimen lens. One- and two-dimensional iterative phase retrievals were executed. Images reconstructed from the diffraction pattern alone showed a characteristic structure of MWCNTs with the finest feature corresponding to a carbon wall spacing of 0.34 nm.American Institute of Physics (AIP)Journal Articleapplication/pdfhttp://hdl.handle.net/2115/45432https://eprints.lib.hokudai.ac.jp/dspace/bitstream/2115/45432/1/20080115_20kVDiffractionMicroscopy_kamimura_APL.pdf0003-69511077-3118AA00543431Applied Physics Letters922024106-1024106-32008-01enginfo:doi/10.1063/1.2834372Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.publisher