2024-03-28T17:36:43Zhttps://eprints.lib.hokudai.ac.jp/dspace-oai/requestoai:eprints.lib.hokudai.ac.jp:2115/520612022-11-17T02:08:08Zhdl_2115_20057hdl_2115_148Temperature dependent carrier dynamics in telecommunication band InAs quantum dots and dashes grown on InP substratesJahan, Nahid A.Hermannstädter, ClausHuh, Jae-HoonSasakura, HirotakaRotter, Thomas J.Ahirwar, PankajBalakrishnan, GaneshAkahane, KouichiSasaki, MasahideKumano, HidekazuSuemune, Ikuoelongationexcited statesIII-V semiconductorsindium compoundsoscillator strengthsphotoluminescencequenching (thermal)semiconductor growthsemiconductor quantum dotswetting421InAs quantum dots (QDs) grown on InP substrates can be used as light emitters in the telecommunication bands. In this paper, we present optical characterization of high-density circular quantum dots (QDots) grown on InP(311)B substrates and elongated dots (QDashes) grown on InP(001) substrates. We study the charge carrier transfer and luminescence thermal quenching mechanisms of the QDots and QDashes by investigating the temperature dependence of their time-integrated and time-resolved photoluminescence properties. This results in two different contributions of the thermal activation energies. The larger activation energies are attributed to the carrier escape to the barrier layer and the wetting layer (WL) from QDots and QDashes, respectively. The smaller activation energies are found to be originated from inter-dot/dash carrier transfer via coupled excited states. The variation of the average oscillator strength associated with the carrier re-distribution is discussed. The relation of the two activation energies is also quantitatively studied with the measurements of excited-state and ground-state energy separations. Finally, we show an approach to isolate individual quantum dots or dashes in a suitable nanostructure.American Institute of PhysicsJournal Articleapplication/pdfhttp://hdl.handle.net/2115/52061https://eprints.lib.hokudai.ac.jp/dspace/bitstream/2115/52061/1/JAP113-3_033506.pdf0021-8979Journal of Applied Physics11330335062013-01-21enginfo:doi/10.1063/1.4775768Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 113, 033506 (2013) and may be found at https://dx.doi.org/10.1063/1.4775768publisher