2024-03-29T10:24:01Zhttps://eprints.lib.hokudai.ac.jp/dspace-oai/requestoai:eprints.lib.hokudai.ac.jp:2115/57962022-11-17T02:08:08Zhdl_2115_20045hdl_2115_139Photothermal probing of inhomogeneously modulated transparent thin filmsWright, O. B.Li Voti, R.Matsuda, O.Larciprete, M. C.Bertolotti, M.Sibilia, C.425The problem of the photothermal modulation of optical beams passing through multilayer films is an extremely complex one owing to the inhomogeneously modulated refractive index combined with multiple optical reflections inside the sample. This problem has so far not been given an exact analytical treatment in the field of photothermal probing. We consider here such a treatment for normal-incidence optical probing in reflectance of photothermally modulated single-layer thin-film samples with arbitrary optical constants. The validity of the method is demonstrated by application to a thin transparent film of silica on a silicon substrate.American Institute of PhysicsJournal Articleapplication/pdfhttp://hdl.handle.net/2115/5796https://eprints.lib.hokudai.ac.jp/dspace/bitstream/2115/5796/1/JAP91-8.pdfJOURNAL OF APPLIED PHYSICS918500250092002-04-15enginfo:doi/10.1063/1.1462414Copyright © 2002 American Institute of Physicspublisher