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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
bulletin (article)高橋, 平七郎; 柴山, 環樹; 長谷川, 英樹; 大野, 英男高分解能電子顕微鏡による化合物半導体/酸化絶縁膜界面構造の観察Observation of Interfaces of Compound Semiconductors by High Resolution Electron Microscope北海道大學工學部研究報告Bulletin of the Faculty of Engineering, Hokkaido University30-Sep-1988
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