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Hashizume, Tamotsu
;
Kotani, Junji
;
Basile, Alberto
;
Kaneko, Masamitsu
Surface Control Process of AlGaN for Suppression of Gate Leakage Currents in AlGaN/GaN Heterostructure Field Effect Transistors
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Japanese Journal of Applied Physics. Pt. 2, Letters & express letters
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Feb-2006
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