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Hokkaido University Collection of Scholarly and Academic Papers >
Showing results 1 to 4 of 4
| Type | Author(s) | Title | Other Titles | Citation | Citation(alt) | Issue Date | | bookchapter | Arita, Masashi; Hamada, Kouichi; Takahashi, Yasuo; Sueoka, Kazuhisa; Shibayama, Tamaki | In Situ Transmission Electron Microscopy for Electronics | - | - | - | 2-Sep-2015 |
| article | Fujii, Takashi; Arita, Masashi; Hamada, Kouichi; Takahashi, Yasuo; Sakaguchi, Norihito | In-situ transmission electron microscopy of conductive filaments in NiO resistance random access memory and its analysis | - | Journal of Applied Physics | - | 28-Feb-2013 |
| article | Fujii, Takashi; Arita, Masashi; Hamada, Kouichi; Kondo, Hirofumi; Kaji, Hiromichi; Takahashi, Yasuo; Moniwa, Masahiro; Fujiwara, Ichiro; Yamaguchi, Takeshi; Aoki, Masaki; Maeno, Yoshinori; Kobayashi, Toshio; Yoshimaru, Masaki | I-V measurement of NiO nanoregion during observation by transmission electron microscopy | - | Journal of Applied Physics | - | 1-Mar-2011 |
| article (author version) | Arita, Masashi; Hirose, Ryusuke; Hamada, Kouichi; Takahashi, Yasuo | Conductance measurements of nanoscale regions with in situ transmission electron microscopy | - | Materials Science and Engineering: C | - | Jun-2006 |
Showing results 1 to 4 of 4
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