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Ochi, Ryota
;
Maeda, Erika
;
Nabatame, Toshihide
;
Shiozaki, Koji
;
Sato, Taketomo
;
Hashizume, Tamotsu
Gate controllability of HfSiOx/AlGaN/GaN MOS high-electron-mobility transistor
-
AIP Advances
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10-Jun-2020
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