|
|
Hokkaido University Collection of Scholarly and Academic Papers >
Showing results 1 to 8 of 8
| Type | Author(s) | Title | Other Titles | Citation | Citation(alt) | Issue Date | | lecture | Sueoka, Kazuhisa | Breakthroughs with Electronics | エレクトロニクスでここを掘れ | - | - | 30-Oct-2011 |
| article | Okada, Akinori; Mizutani, Yusuke; Subagyo, Agus; Hosoi, Hirotaka; Nakamura, Motonori; Sueoka, Kazuhisa; Kawahara, Koichi; Okajima, Takaharu | Direct observation of dynamic force propagation between focal adhesions of cells on microposts by atomic force microscopy | - | Applied Physics Letters | - | 26-Dec-2011 |
| bulletin (article) | Hosoi, Hirotaka; Sueoka, Kazuhisa; Hatta, Eiji; Ishii, Toshio; Mukasa, Kōichi | Observation of Organic Molecules by Scanning Tunneling Microscope | - | Memoirs of the Faculty of Engineering, Hokkaido University | 北海道大学工学部紀要 | 1993 |
| article (author version) | Takeda, Seiji; Nakamura, Motonori; Ishii, Atsushi; Subagyo, Agus; Hosoi, Hirotaka; Sueoka, Kazuhisa; Mukasa, Koichi | A pH sensor based on electric properties of nanotubes on a glass substrate | - | Nanoscale Research Letters | - | Apr-2007 |
| article | Yoh, Kanji; Ohno, Hiroshi; Sueoka, Kazuhisa; Ramsteiner, Manfred E. | Reduced interface reaction during the epitaxial Fe growth on InAs for high efficiency spin injection | - | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures | - | May-2004 |
| article | Oka, Hirofumi; Sueoka, Kazuhisa | Spin-polarized scanning tunneling microscopy and spectroscopy study of c(2x2) reconstructed Cr(001) thin film surfaces | - | Journal of applied physics | - | 15-Apr-2006 |
| article (author version) | Ishii, Atsushi; Takeda, Seiji; Hattori, Satoshi; Sueoka, Kazuhisa; Mukasa, Koichi | Ultrasensitive detection of organophosphate insecticides by carbon nanotube field-effect transistor | - | Colloids and Surfaces A Physicochemical and Engineering Aspects | - | 1-Feb-2007 |
| bulletin (article) | 佐々木, 泰; 末岡, 和久; 岩田, 達夫; 宮尾, 正大; 安達, 洋; 早川, 和延; 武笠, 幸一 | 集束イオンビームの探針加工への応用 | Study of Focused Ion Beams for Probe Tip Milling | 北海道大學工學部研究報告 | Bulletin of the Faculty of Engineering, Hokkaido University | 28-Jul-1995 |
Showing results 1 to 8 of 8
|
