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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
articleOgawa, Takahiro; Takahashi, Sho; Wada, Naofumi; Tanaka, Akira; Haseyama, MikiBinary Sparse Representation Based on Arbitrary Quality Metrics and Its Applications-IEICE transactions on fundamentals of electronics, communications and computer sciences-Nov-2018
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