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Electron hydration dynamics in water clusters: A direct ab initio molecular dynamics approach

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Title: Electron hydration dynamics in water clusters: A direct ab initio molecular dynamics approach
Authors: Tachikawa, Hiroto Browse this author →KAKEN DB
Issue Date: 14-Oct-2006
Publisher: American Institute of Physics
Journal Title: The Journal of Chemical Physics
Volume: 125
Start Page: 144307
Publisher DOI: 10.1063/1.2348870
PMID: 17042590
Abstract: Electron attachment dynamics of excess electron in water cluster (H2O)n (n=2 and 3) have been investigated by means of full-dimensional direct ab initio molecular dynamics (MD) method at the MP2/6-311++G(d,p) level. It was found that the hydrogen bond breaking due to the excess electron is an important process in the first stage of electron capture in water trimer. Time scale of electron localization and hydrogen bond breaking were determined by the direct ab initio MD simulation. The initial process of hydration in water cluster is clearly visualized in the present study. In n=3, an excess electron is first trapped around the cyclic water trimer with a triangular form, where the excess electron is equivalently distributed on the three water molecules at time zero. After 50 fs, the excess electron is concentrated into two water molecules, while the potential energy of the system decreases by –1.5 kcal/mol from the vertical point. After 100 fs, the excess electron is localized in one of the water molecules and the potential energy decreases by –5.3 kcal/mol, but the triangular form still remained. After that, one of the hydrogen bonds in the triangular form is gradually broken by the excess electron, while the structure becomes linear at 100–300 fs after electron capture. The time scale of hydrogen bond breaking due to the excess electron is calculated to be about 300 fs. Finally, a dipole bound state is formed by the linear form of three water molecules. In the case of n=2, the dipole bound anion is formed directly. The mechanism of electron hydration dynamics was discussed on the basis of theoretical results. ©2006 American Institute of Physics
Rights: Copyright © 2006 American Institute of Physics
Type: article
URI: http://hdl.handle.net/2115/15424
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 田地川 浩人

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