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CMOS Smart Sensor for Monitoring the Quality of Perishables

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/22218

Title: CMOS Smart Sensor for Monitoring the Quality of Perishables
Authors: Ueno, K. Browse this author
Hirose, T. Browse this author
Asai, T. Browse this author →KAKEN DB
Amemiya, Y. Browse this author →KAKEN DB
Issue Date: Apr-2007
Publisher: IEEE
Journal Title: IEEE Journal of Solid-State Circuits
Volume: 42
Issue: 4
Start Page: 798
End Page: 803
Publisher DOI: 10.1109/JSSC.2007.891676
Abstract: We developed a CMOS integrated-circuit sensor to monitor the change in quality of perishables that depends on surrounding temperatures. Our sensor makes use of the fact that the temperature dependence of the subthreshold current in MOSFETs is analogous to that of the degradation of perishables. The sensor is attached to perishable goods such as farm and marine products and is distributed from producers to consumers along with the goods. During their distribution process, the sensor measures the surrounding temperatures and emulates the degradation of the goods caused by the temperature. By reading the output of the sensor, consumers can determine whether the goods are fresh or not. Our sensor consists of subthreshold CMOS circuits with a low-power consumption of 10 muW or lower.
Rights: © 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. IEEE, Journal of Solid-State Circuits, Vol. 42, issue 4, 2007, pp. 798-803
Type: article
URI: http://hdl.handle.net/2115/22218
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 上野 憲一

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