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Generalized Simple Theory for Estimating Lateral Leakage Loss Behavior in Silicon-on-Insulator Ridge Waveguides

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/39952

Title: Generalized Simple Theory for Estimating Lateral Leakage Loss Behavior in Silicon-on-Insulator Ridge Waveguides
Authors: Kakihara, Kuniaki Browse this author
Saitoh, Kunimasa Browse this author →KAKEN DB
Koshiba, Masanori Browse this author →KAKEN DB
Keywords: Finite-element method (FEM)
leaky waves
optical losses
optical waveguides
silicon-on-insulator (SOI) technology
Issue Date: 1-Dec-2009
Publisher: IEEE - Institute of Electrical and Electronics Engineers
Journal Title: Journal of Lightwave Technology
Volume: 27
Issue: 23
Start Page: 5492
End Page: 5499
Publisher DOI: 10.1109/JLT.2009.2027720
Abstract: In this paper, we numerically investigate the lateral leakage loss behavior for TM-like modes in silicon-on-insulator ridge waveguides. If the waveguide width is set to satisfy a certain condition, the leakage loss of the TM-like mode leads to be a minimum. When utilizing TM-like modes in the ridge waveguides, it is the main drawback that the tolerance for the variations in the waveguide width and operation wavelength is too small. In this paper, we propose a novel ridge waveguide structure, where a dimple is introduced at the ridge region. It is shown from the finite-element analysis that the ridge waveguide with a dimple is both low loss and fabrication tolerant.
Rights: © 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Type: article
URI: http://hdl.handle.net/2115/39952
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

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