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Surface Roughness and Magnetic Properties of Ni and Ni78Fe22 Thin Films on Polyethylene Naphthalate Organic Substrates
| Title: | Surface Roughness and Magnetic Properties of Ni and Ni78Fe22 Thin Films on Polyethylene Naphthalate Organic Substrates |
| Authors: | Kaiju, Hideo Browse this author →KAKEN DB | | Basheer, Nubla Browse this author | | Kondo, Kenji Browse this author →KAKEN DB | | Ishibashi, Akira Browse this author |
| Keywords: | Magnetic thin films | | polyethylene naphtalate organic substrates | | spin quantum cross devices | | vacuum evaporation |
| Issue Date: | Jun-2010 |
| Publisher: | IEEE: Institute of Electrical and Electronics Engineers |
| Journal Title: | IEEE Transactions on Magnetics |
| Volume: | 46 |
| Issue: | 6 |
| Start Page: | 1356 |
| End Page: | 1359 |
| Publisher DOI: | 10.1109/TMAG.2010.2045346 |
| Abstract: | We have studied structural, electrical, and magnetic properties of Ni and Ni78Fe22 thin films evaporated on polyethylene naphtalate (PEN) organic substrates towards the fabrication of spin quantum cross (SQC) devices. As we have investigated the scaling properties on the surface roughness, the surface roughness of Ni (16 nm)/PEN is 0.34 nm, corresponding to 2 or 3 atomic layers, in the scanning scale of 16 nm, and the surface roughness of Ni78Fe22 (14 nm)/PEN is also as small as 0.25 nm, corresponding to less than 2 atomic layers, in the scanning scale of 14 nm. These facts denote that Ni/PEN and Ni78Fe22/PEN are suitable for magnetic electrodes on organic substrates used for SQC devices from the viewpoint of the surface morphology. Then, we have investigated magnetic hysteresis curve and magnetoresistance effects for Ni/PEN and Ni78Fe22/PEN. The squareness of the hysteresis loop is as small as 0.24 for Ni (25 nm)/PEN, where there is no observation of the anisotropy magnetoresistance (AMR) effect. In contrast, the squareness of the hysteresis loop is as large as 0.86 for Ni78Fe22 (26 nm)/PEN, where the AMR effect has been successfully obtained. These experimental results indicate that Ni78Fe22/PEN is a promising material for use in SQC devices from the viewpoint of not only the surface morphologies but also magnetic properties. |
| Rights: | © 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
| Type: | article |
| URI: | http://hdl.handle.net/2115/43114 |
| Appears in Collections: | 電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 海住 英生
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