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Electron track analysis for damage formation in bio-cells

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Title: Electron track analysis for damage formation in bio-cells
Authors: Yoshii, Y. Browse this author
Sutherland, K. L. Browse this author
Date, H. Browse this author →KAKEN DB
Keywords: Electron track
Monte Carlo simulation
Aggregation index
Ionization cluster
Issue Date: 1-Sep-2011
Publisher: Elsevier B.V.
Journal Title: Nuclear Instruments and Methods in Physics Research Section B : Beam Interactions with Materials and Atoms
Volume: 269
Issue: 17
Start Page: 1887
End Page: 1891
Publisher DOI: 10.1016/j.nimb.2011.05.028
Abstract: The track structure of electrons generated in bio-tissues exposed to X-rays (or other radiation particles) is essential to cell damage. This paper reports on Monte Carlo track simulations of electrons to determine the degree of concentration of ionization and excitation events as the aggregation index (AI). AI is expected to correlate with the number of lesions in a cell nucleus, such as double-strand breaks (DSBs), which may lead to lethality of cells. The simulation results show that AI as a function of electron energy has a peak in low energy (sub-keV) regions and the induction of the lesions may be attributed to the ionization and excitation clusters generated in the tissues. The track pattern, associated with the primary track and secondary branch tracks, is also illustrated by counting the number of the branching points given by the ionization.
Type: article (author version)
Appears in Collections:保健科学院・保健科学研究院 (Graduate School of Health Sciences / Faculty of Health Sciences) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 伊達 広行

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