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Snapshot imaging Mueller matrix polarimeter using polarization gratings
Title: | Snapshot imaging Mueller matrix polarimeter using polarization gratings |
Authors: | Kudenov, Michael W. Browse this author | Escuti, Michael J. Browse this author | Hagen, Nathan Browse this author | Dereniak, Eustace L. Browse this author | Oka, Kazuhiko Browse this author →KAKEN DB |
Issue Date: | 15-Apr-2012 |
Publisher: | Optical Society of America |
Journal Title: | Optics Letters |
Volume: | 37 |
Issue: | 8 |
Start Page: | 1367 |
End Page: | 1369 |
Publisher DOI: | 10.1364/OL.37.001367 |
Abstract: | A snapshot imaging Mueller matrix polarimeter (SIMMP) is theoretically described and empirically demonstrated through simulation. Spatial polarization fringes are localized onto a sample by incorporating polarization gratings (PGs) into a polarization generator module. These fringes modulate the Mueller matrix (MM) components of the sample, which are subsequently isolated with PGs in an analyzer module. The MM components are amplitude modulated onto spatial carrier frequencies which, due to the PGs, maintain high visibility in spectrally broadband illumination. An interference model of the SIMMP is provided, followed by methods of reconstruction and calibration. Lastly, a numerical simulation is used to demonstrate the system's performance in the presence of noise. |
Rights: | © 2012 Optical Society of America |
Type: | article |
URI: | http://hdl.handle.net/2115/49323 |
Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 岡 和彦
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