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Snapshot imaging Mueller matrix polarimeter using polarization gratings

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Title: Snapshot imaging Mueller matrix polarimeter using polarization gratings
Authors: Kudenov, Michael W. Browse this author
Escuti, Michael J. Browse this author
Hagen, Nathan Browse this author
Dereniak, Eustace L. Browse this author
Oka, Kazuhiko Browse this author →KAKEN DB
Issue Date: 15-Apr-2012
Publisher: Optical Society of America
Journal Title: Optics Letters
Volume: 37
Issue: 8
Start Page: 1367
End Page: 1369
Publisher DOI: 10.1364/OL.37.001367
Abstract: A snapshot imaging Mueller matrix polarimeter (SIMMP) is theoretically described and empirically demonstrated through simulation. Spatial polarization fringes are localized onto a sample by incorporating polarization gratings (PGs) into a polarization generator module. These fringes modulate the Mueller matrix (MM) components of the sample, which are subsequently isolated with PGs in an analyzer module. The MM components are amplitude modulated onto spatial carrier frequencies which, due to the PGs, maintain high visibility in spectrally broadband illumination. An interference model of the SIMMP is provided, followed by methods of reconstruction and calibration. Lastly, a numerical simulation is used to demonstrate the system's performance in the presence of noise.
Rights: © 2012 Optical Society of America
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 岡 和彦

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