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Experiment and Simulation of Impregnated No-Insulation REBCO Pancake Coil

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/61482

Title: Experiment and Simulation of Impregnated No-Insulation REBCO Pancake Coil
Authors: Noguchi, So Browse this author →KAKEN DB
Monma, Katsutoshi Browse this author
Iwai, Sadanori Browse this author
Miyazaki, Hiroshi Browse this author
Tosaka, Taizo Browse this author
Nomura, Shunji Browse this author
Kurusu, Tsutomu Browse this author
Ueda, Hiroshi Browse this author →KAKEN DB
Ishiyama, Atsushi Browse this author
Urayama, Shinichi Browse this author
Fukuyama, Hidenao Browse this author →KAKEN DB
Keywords: Epoxy resin impregnation
high-temperature superconducting coil
no-insulation technique
Issue Date: Jun-2016
Publisher: IEEE (Institute of Electrical and Electronics Engineers)
Journal Title: IEEE Transactions on Applied Superconductivity
Volume: 26
Issue: 4
Start Page: 4601305
Publisher DOI: 10.1109/TASC.2016.2536736
Abstract: It is important to investigate the stability and behavior of an epoxy-resin-impregnated no-insulation (NI) REBCO pancake coil to implement high-field applications, such as ultra-high-field magnetic resonance imaging. We have performed sudden discharging and overcurrent tests for the impregnated NI REBCO pancake coil. From the discharging test, the contact resistivity is estimated, and it changes depending on the initial current. From the overcurrent test, the high thermal stability of the impregnated NI REBCO pancake coil is confirmed. The REBCO pancake coil is charged up to 67 A though the critical current is only 46 A, and no degradation has been found. To investigate in detail the electromagnetic behavior of an impregnated NI REBCO pancake coil, the simulation is performed by means of the partial element equivalent circuit (PEEC) model. In the sudden discharging test, the simulation results for the case of lower initial current are in good agreement with the experimental data. As can be inferred from the simulation results, the current drastically decreases from the inside of the impregnated NI REBCO pancake coil. The result of the overcurrent simulation is almost identical to the experimental one. However, since the contact resistivity is presumed to be constant in the simulation, the difference is observed in the high current region.
Rights: © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Type: article (author version)
URI: http://hdl.handle.net/2115/61482
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 野口 聡

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