Permalink : http://hdl.handle.net/2115/36772

The X-ray diffraction study of todorokite from Japan was carried out and appropriate structural model was calculated by Rietveld method. The calculation of the theoretical diffraction pattern was done for a layer structural model and the calculated results show that the layer model can explain the observed diffraction data. Some of the properties of todorokite such as superstructure or shrinkage of c-axis on heating can be explained by the layer model which contains random H2O between the [MnO6] layers.