Conductance measurements of nanoscale regions with in situ transmission electron microscopy

Arita, Masashi; Hirose, Ryusuke; Hamada, Kouichi et al.

Materials Science and Engineering: C, 2006, 26(5-7), 776-781

Permalink : https://hdl.handle.net/2115/14442

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アクセス権
open access
URI
https://hdl.handle.net/2115/14442
タイトル
Conductance measurements of nanoscale regions with in situ transmission electron microscopy
著者
Arita, Masashi ; Hirose, Ryusuke ; Hamada, Kouichi ; Takahashi, Yasuo
e-Rad_Researcher
20222755
著者名
Arita, Masashi
著者名
Hirose, Ryusuke
著者名
Hamada, Kouichi
著者名
Takahashi, Yasuo
言語
英語
キーワード
transmission electron microscopy
scanning tunnelling spectroscopy
SrF2
Fe-SrF2 granular film
Coulomb staircase
発行日
2006-06
出版者
Elsevier
収録物名
Materials Science and Engineering: C
巻(号)
26(5-7)
ページ
776-781
抄録
Conductance measurements of nanostructures with simultaneous transmission electron microscopy (TEM) were performed on thin insulating SrF2 films (3 nm thick) and Fe-SrF2 granular films (10 nm thick) deposited on tip-shaped An electrodes. By using a movable counter electrode, nanoscale regions were selected for investigation. Systematic measurements taken during the deformation of the SrF2, film by the counter-electrode provided a tunnelling barrier height of about 2.5 eV The conductance of Fe-SrF2 in nanoscale (similar to 500 nm(2)) showed the Coulomb staircase like characteristics at room temperature. The staircase period approximately corresponded to the value estimated from the geometry observed by TEM. The feasibility of this method is briefly described.
資源タイプ
学術雑誌論文
出版タイプ
Accepted Manuscript
権利情報
Copyright © 2005 Elsevier B.V. All rights reserved.
PISSN
0928-4931
関連情報
URI
http://www.sciencedirect.com/science/journal/09284931
関連情報 (isVersionOf)
出版社版DOI
https://doi.org/10.1016/j.msec.2005.09.029