open access

https://hdl.handle.net/2115/35000

Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm

英語

2008

Electrochemical Society

Electrochemical and Solid-State Letters

11(11)

P13-P16

AlxSi1-xOn films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub-100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-xOn films increases with decreasing the thickness.

学術雑誌論文

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© The Electrochemical Society, Inc. 2008. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in Electrochem. Solid-State Lett., Volume 11, Issue 11, pp. P13-P16 (2008).

1099-0062