open access

https://hdl.handle.net/2115/42549

Nanoscale mechanical contacts probed with ultrashort acoustic and thermal waves

英語

2009-12-15

American Physical Society

Physical Review B

80(23)

235409

Using an ultrafast optical technique we measure coherent phonon-pulse reflection from - and heat flow across - a mechanical contact of nanoscale thickness between a thin metal film and a spherical dielectric indenter. Picosecond phonon wave packets at ∼50 GHz returning from this interface probe the pressure distribution, the contact area, and the indentation profile to subnanometer resolution, revealing the film deformation in situ. These measurements and simultaneous thermal-wave imaging at ≳1 MHz are consistent with significant enhancement of phonon transport across the near-contact nanogap.

学術雑誌論文

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©2009 The American Physical Society

1098-0121