Study on reaction mechanism of dehydrogenation of magnesium hydride by in situ transmission electron microscopy

Isobe, Shigehito; Ono, Akifumi; Yao, Hao; Wang, Yongming; Hashimoto, Naoyuki; Ohnuki, Somei

Study on reaction mechanism of dehydrogenation of magnesium hydride by in situ transmission electron microscopy

Isobe, Shigehito; Ono, Akifumi; Yao, Hao et al.

Applied Physics Letters, 2010, 96(22), 223109

Permalink : https://hdl.handle.net/2115/43131

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アクセス権	open access
URI	https://hdl.handle.net/2115/43131
タイトル	Study on reaction mechanism of dehydrogenation of magnesium hydride by in situ transmission electron microscopy
著者	Isobe, Shigehito ; Ono, Akifumi ; Yao, Hao ; Wang, Yongming ; Hashimoto, Naoyuki ; Ohnuki, Somei
e-Rad_Researcher 10564370 著者名 Isobe, Shigehito
著者名 Ono, Akifumi
著者名 Yao, Hao
著者名 Wang, Yongming
著者名 Hashimoto, Naoyuki
e-Rad_Researcher 10142697 著者名 Ohnuki, Somei
言語	英語
キーワード	chemical analysis
	chemical interdiffusion
	hydrogen
	hydrogen storage
	magnesium compounds
	nanoparticles
	pyrolysis
	thermally stimulated desorption
	transmission electron microscopy
発行日	2010-05-31
出版者	American Institute of Physics
収録物名	Applied Physics Letters
巻(号)	96(22)
ページ	223109
抄録	In situ observation on dehydrogenation of MgH2 was performed by using transmission electron microscope (TEM). The dehydrogenation of MgH2 with 1 mol % Nb2O5 and formation of nanosized Mg particles were observed at 150℃. Nb2O5 was not confirmed in diffraction patterns and TEM images probably due to wide dispersion. On MgH2 with 10 mol % Nb2O5, the high resolution TEM could recognize the dehydrogenation at the interface between MgH2 and Nb2O5, proceeding with increasing temperature. This suggests that hydrogen atoms could diffuse from MgH2 phase to the interface between Mg and Nb2O5, resulting in formation of hydrogen molecules at the interface.
資源タイプ	学術雑誌論文
出版タイプ	Version of Record
権利情報	Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 96, 223109 (2010) and may be found at https://dx.doi.org/10.1063/1.3442910
PISSN	0003-6951
関連情報 (isIdenticalTo)	出版社版DOI https://doi.org/10.1063/1.3442910