Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes

Kamimura, Osamu; Kawahara, Kota; Doi, Takahisa et al.

Applied Physics Letters, 2008, 92(2), 024106-1-024106-3

Permalink : https://hdl.handle.net/2115/45432

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アクセス権
open access
URI
https://hdl.handle.net/2115/45432
タイトル
Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes
著者
Kamimura, Osamu ; Kawahara, Kota ; Doi, Takahisa ; Dobashi, Takashi ; Abe, Takashi ; Gohara, Kazutoshi
著者名
Kamimura, Osamu
著者名
Kawahara, Kota
著者名
Doi, Takahisa
著者名
Dobashi, Takashi
著者名
Abe, Takashi
著者名
Gohara, Kazutoshi
言語
英語
キーワード
carbon nanotubes
electron diffraction
electron microscopy
image reconstruction
発行日
2008-01
出版者
American Institute of Physics (AIP)
収録物名
Applied Physics Letters
巻(号)
92(2)
ページ
024106-1-024106-3
抄録
Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for radiation-sensitive materials. Fine, homogeneous, and isolated multiwall carbon nanotubes (MWCNTs) were used as specimens. To avoid lens aberrations, the diffraction patterns were recorded without a postspecimen lens. One- and two-dimensional iterative phase retrievals were executed. Images reconstructed from the diffraction pattern alone showed a characteristic structure of MWCNTs with the finest feature corresponding to a carbon wall spacing of 0.34 nm.
資源タイプ
学術雑誌論文
出版タイプ
Version of Record
権利情報
Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
PISSN
0003-6951
EISSN
1077-3118
NCID
AA00543431
関連情報 (isIdenticalTo)
出版社版DOI
https://doi.org/10.1063/1.2834372