In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching

Fujii, Takashi; Arita, Masashi; Takahashi, Yasuo; Fujiwara, Ichiro

In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching

Fujii, Takashi; Arita, Masashi; Takahashi, Yasuo et al.

Applied Physics Letters, 2011, 98(21), 212104

Permalink : https://hdl.handle.net/2115/45755

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アクセス権	open access
URI	https://hdl.handle.net/2115/45755
タイトル	In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching
著者	Fujii, Takashi ; Arita, Masashi ; Takahashi, Yasuo ; Fujiwara, Ichiro
著者名 Fujii, Takashi
e-Rad_Researcher 20222755 著者名 Arita, Masashi
著者名 Takahashi, Yasuo
著者名 Fujiwara, Ichiro
言語	英語
キーワード	copper
	electrical conductivity transitions
	electrical resistivity
	electron diffraction
	germanium compounds
	metal-insulator boundaries
	nanofabrication
	nanostructured materials
	solid electrolytes
	thin films
	transmission electron microscopy
	X-ray chemical analysis
発行日	2011-05-23
出版者	American Institute of Physics
収録物名	Applied Physics Letters
巻(号)	98(21)
ページ	212104
抄録	An in situ transmission electron microscopy (TEM) analysis of a solid electrolyte, Cu-GeS, during resistance switching is reported. Real-time observations of the filament formation and disappearance process were performed in the TEM instrument and the conductive-filament-formation model was confirmed experimentally. Narrow conductive filaments were formed corresponding to resistance switching from high- to low-resistance states. When the resistance changed to high- resistance state, the filament disappeared. It was also confirmed by use of selected area diffractometry and energy-dispersive x-ray spectroscopy that the conductive filament was made of nanocrystals composed mainly of Cu.
資源タイプ	学術雑誌論文
出版タイプ	Version of Record
権利情報	Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 98, 212104 (2011) and may be found at https://dx.doi.org/10.1063/1.3593494
PISSN	0003-6951
関連情報 (isIdenticalTo)	出版社版DOI https://doi.org/10.1063/1.3593494