open access

https://hdl.handle.net/2115/52340

Ice crystal orientation measurement using Laue X-ray diffraction method

日本語

2013-03-31

Institute of Low Temperature Science, Hokkaido University

Low Temperature Science

71

59-68

Ice crystal c-axis orientation of ice core samples have been investigated in detail as a major controlling factor of the mechanical properties of ice sheets. The universal stage was a common measurement device for c-axis orientation. The measurement procedure using this device is very time-consuming, involving tedious work in a cold laboratory. Instead, automated measuring devices have been widely used in recent years. Those are very effective for the analysis of large amounts of samples with more than 2000 m long ice core. However, the automated devices do not have a sufficient measurement accuracy to reveal details of the exceptional crystal orientation distribution such as the very strong single maximum existing in the deep part of ice sheet. Therefore, in order to obtain high accuracy, a new ice crystal orientation measuring device has been developed using the Laue X-ray diffraction method. This paper describes the development of this new device and examples of applying it to various researches.

紀要論文

Version of Record

1880-7593