Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser

Tanaka, Yoshihito; Ito, Kiminori; Nakatani, Takashi et al.

Journal of the Ceramic Society of Japan, 2013, 121(1411), 283-286

Permalink : https://hdl.handle.net/2115/52780

このアイテムのアクセス数:1,400件（2026-08-17 13:25 集計）

閲覧可能ファイル 

ファイル フォーマット サイズ 閲覧回数 説明
121_JCSJ-P12210 pdf 797 KB 1,237

論文情報

ファイル出力 EndNote Basic出力 Mendeley出力

アクセス権
open access
URI
https://hdl.handle.net/2115/52780
タイトル
Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser
著者
Tanaka, Yoshihito ; Ito, Kiminori ; Nakatani, Takashi ; Onitsuka, Rena ; Newton, Marcus ; Sato, Takahiro ; Togashi, Tadashi ; Yabashi, Makina ; Kawaguchi, Tomoya ; Shimada, Koki ; Tokuda, Kazuya ; Takahashi, Isao ; Ichitsubo, Tetsu ; Matsubara, Eiichiro ; Nishino, Yoshinori
著者名
Tanaka, Yoshihito
著者名
Ito, Kiminori
著者名
Nakatani, Takashi
著者名
Onitsuka, Rena
e-Rad_Researcher
60608652
著者名
Newton, Marcus
著者名
Sato, Takahiro
著者名
Togashi, Tadashi
著者名
Yabashi, Makina
著者名
Kawaguchi, Tomoya
著者名
Shimada, Koki
著者名
Tokuda, Kazuya
著者名
Takahashi, Isao
著者名
Ichitsubo, Tetsu
著者名
Matsubara, Eiichiro
e-Rad_Researcher
40392063
著者名
Nishino, Yoshinori
言語
英語
キーワード
Coherent X-ray diffraction
Time-resolved measurement
X-ray free electron laser
Semiconductor
Nanocrystal
発行日
2013-03-01
出版者
The Ceramic Society of Japan
日本セラミックス協会
収録物名
Journal of the Ceramic Society of Japan
巻(号)
121(1411)
ページ
283-286
抄録
Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)-XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100 nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed. (C)2013 The Ceramic Society of Japan. All rights reserved.
資源タイプ
学術雑誌論文
出版タイプ
Version of Record
PISSN
1882-0743