A new spectroelectrochemical cell for in situ measurement of Pt and Au K-edge X-ray absorption fine structure

Kaito, Takahiro; Mitsumoto, Hisashi; Sugawara, Seiho; Shinohara, Kazuhiko; Uehara, Hiromitsu; Ariga, Hiroko; Takakusagi, Satoru; Asakura, Kiyotaka

A new spectroelectrochemical cell for in situ measurement of Pt and Au K-edge X-ray absorption fine structure

Kaito, Takahiro; Mitsumoto, Hisashi; Sugawara, Seiho et al.

Review of scientific instruments, 2014, 85(8), 084104-1-084104-8

Permalink : https://hdl.handle.net/2115/57963

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アクセス権	open access
URI	https://hdl.handle.net/2115/57963
タイトル	A new spectroelectrochemical cell for in situ measurement of Pt and Au K-edge X-ray absorption fine structure
著者	Kaito, Takahiro ; Mitsumoto, Hisashi ; Sugawara, Seiho ; Shinohara, Kazuhiko ; Uehara, Hiromitsu ; Ariga, Hiroko ; Takakusagi, Satoru ; Asakura, Kiyotaka
著者名 Kaito, Takahiro
著者名 Mitsumoto, Hisashi
著者名 Sugawara, Seiho
著者名 Shinohara, Kazuhiko
著者名 Uehara, Hiromitsu
著者名 Ariga, Hiroko
e-Rad_Researcher 30359484 著者名 Takakusagi, Satoru
e-Rad_Researcher 60175164 著者名 Asakura, Kiyotaka
言語	英語
発行日	2014-08
出版者	American Institute of Physics
収録物名	Review of scientific instruments
巻(号)	85(8)
ページ	084104-1-084104-8
抄録	A new spectroelectrochemical cell to investigate the structure of Pt/Au nanoclusters using Pt and Au K-edge X-ray absorption fine structure (XAFS) measurements under the electrochemical conditions is developed. K-edge XAFS measurements for Pt and Au require a sample as thick as 1-2 cm, which prevents homogeneous potential distribution. We can measure in situ Pt and Au K-edge XAFS spectra and determine reasonable electrochemical surface areas using our developed spectroelectrochemical cell. This work provides a new approach to analyze Pt/Au core-shell nanoclusters. The new cell is designed to be applied to both spectra with high absorption-edge energies such as the K-edge of Pt and Au and those with low absorption-edge energy such as Pt L-edge.
資源タイプ	学術雑誌論文
出版タイプ	Version of Record
権利情報	Copyright 2014 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Review of Scientific Instruments and may be found at http://scitation.aip.org/content/aip/journal/rsi/85/8/10.1063/1.4892531.
PISSN	0034-6748
EISSN	1089-7623
NCID	AA00817730
関連情報	PMID 25173284
関連情報 (isIdenticalTo)	出版社版DOI https://doi.org/10.1063/1.4892531