Experiment and Simulation of Impregnated No-Insulation REBCO Pancake Coil

Noguchi, So; Monma, Katsutoshi; Iwai, Sadanori; Miyazaki, Hiroshi; Tosaka, Taizo; Nomura, Shunji; Kurusu, Tsutomu; Ueda, Hiroshi; Ishiyama, Atsushi; Urayama, Shinichi; Fukuyama, Hidenao

Experiment and Simulation of Impregnated No-Insulation REBCO Pancake Coil

Noguchi, So; Monma, Katsutoshi; Iwai, Sadanori et al.

IEEE Transactions on Applied Superconductivity, 2016, 26(4), 4601305

Permalink : https://hdl.handle.net/2115/61482

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アクセス権	open access
URI	https://hdl.handle.net/2115/61482
タイトル	Experiment and Simulation of Impregnated No-Insulation REBCO Pancake Coil
著者	Noguchi, So ; Monma, Katsutoshi ; Iwai, Sadanori ; Miyazaki, Hiroshi ; Tosaka, Taizo ; Nomura, Shunji ; Kurusu, Tsutomu ; Ueda, Hiroshi ; Ishiyama, Atsushi ; Urayama, Shinichi ; Fukuyama, Hidenao
e-Rad_Researcher 30314735 著者名 Noguchi, So
著者名 Monma, Katsutoshi
著者名 Iwai, Sadanori
著者名 Miyazaki, Hiroshi
著者名 Tosaka, Taizo
著者名 Nomura, Shunji
著者名 Kurusu, Tsutomu
e-Rad_Researcher 00160177 著者名 Ueda, Hiroshi
著者名 Ishiyama, Atsushi
著者名 Urayama, Shinichi
e-Rad_Researcher 90181297 著者名 Fukuyama, Hidenao
言語	英語
キーワード	Epoxy resin impregnation
	high-temperature superconducting coil
	no-insulation technique
発行日	2016-06
出版者	IEEE (Institute of Electrical and Electronics Engineers)
収録物名	IEEE Transactions on Applied Superconductivity
巻(号)	26(4)
ページ	4601305
抄録	It is important to investigate the stability and behavior of an epoxy-resin-impregnated no-insulation (NI) REBCO pancake coil to implement high-field applications, such as ultra-high-field magnetic resonance imaging. We have performed sudden discharging and overcurrent tests for the impregnated NI REBCO pancake coil. From the discharging test, the contact resistivity is estimated, and it changes depending on the initial current. From the overcurrent test, the high thermal stability of the impregnated NI REBCO pancake coil is confirmed. The REBCO pancake coil is charged up to 67 A though the critical current is only 46 A, and no degradation has been found. To investigate in detail the electromagnetic behavior of an impregnated NI REBCO pancake coil, the simulation is performed by means of the partial element equivalent circuit (PEEC) model. In the sudden discharging test, the simulation results for the case of lower initial current are in good agreement with the experimental data. As can be inferred from the simulation results, the current drastically decreases from the inside of the impregnated NI REBCO pancake coil. The result of the overcurrent simulation is almost identical to the experimental one. However, since the contact resistivity is presumed to be constant in the simulation, the difference is observed in the high current region.
資源タイプ	学術雑誌論文
出版タイプ	Accepted Manuscript
権利情報	© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
PISSN	1051-8223
関連情報 (isVersionOf)	出版社版DOI https://doi.org/10.1109/TASC.2016.2536736