XRF analysis of major and trace elements for silicate rocks using low dilution ratio fused glass

Tanaka, Ryoji; Orihashi, Yuji

HUEPS Technical Report, 1997, 2, 1-20

Permalink : https://hdl.handle.net/2115/62041

このアイテムのアクセス数:680件（2026-08-11 16:39 集計）

ファイル	フォーマット	サイズ	閲覧回数	説明
HUEPS_TR_2	pdf	1.43 MB	3,508

アクセス権	open access
URI	https://hdl.handle.net/2115/62041
タイトル	XRF analysis of major and trace elements for silicate rocks using low dilution ratio fused glass
著者	著者名 Tanaka, Ryoji
著者	著者名 Orihashi, Yuji
言語	英語
発行日	1997-12
出版者	Division of Earth and Planetary Sciences (Earth and Planetary Materials Science) Graduate School of Science Hokkaido University
収録物名	HUEPS Technical Report
巻(号)	2
ページ	1-20
抄録	An X-ray fluorescence spectrometry (XRF) method to determine 10 major and 18 trace elements in silicate rocks has been investigated. The analysis is carried out on fused glass beads, containing one part rock powder, two parts of lithium metaborate/tetraborate flux and 0.3 parts of lithium n itrate by weight. Calibration lines were established using international silicate rock reference materials. The low dilution fused glass technique effectively eliminates particle size effect, and allows accurate determination of both major and trace elements from single glass beads. Analyses of standard rocks agree well with the recommended values of Imai et al.(1995) for GSJ reference materials, and with those of Potts et al.(1992) for USGS standards.
資源タイプ	報告書
出版タイプ	Not Applicable (or Unknown)
PISSN	1343-0912