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J.Electrochem.Soc.132,1864-1865(1985), Raman spectrosc. -- HgTe	pdf	189 KB	652

論文情報

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アクセス権	open access
URI	https://hdl.handle.net/2115/62182
タイトル	Raman Spectroscopy of Anodic Oxide Films on HgTe
著者	Sakashita, Masao ; Ohtsuka, Toshiaki ; Sato, Norio
著者名 Sakashita, Masao
e-Rad_Researcher 20113532 著者名 Ohtsuka, Toshiaki
著者名 Sato, Norio
言語	英語
キーワード	anodisation
	mercury alloys
	tellurium alloys
	Raman spectroscopy
	heating
	passivation
発行日	1985-08
出版者	The Electrochemical Society
収録物名	J. Electrochemical Society
巻(号)	132(8)
ページ	1864-1865
抄録	Laser Raman spectroscopic measurements of the anodic oxide film formed on HgTe in aqueous solutions reveal the characteristic Raman bands that appear at 422 and 684 cm-'. These bands, which are different from those of crystalline HgTeO3 and TeO2 powders, may be attributed to a complex oxide of HgTe205 or an amorphous oxide of TeO, that might be formed in anodic oxidation. The heating effect on the anodic oxide film due to a focused laser beam is also discussed.
資源タイプ	学術雑誌論文
出版タイプ	Version of Record
権利情報	© The Electrochemical Society, Inc. 1985. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in J. Electrochem. Soc. 1985 volume 132, issue 8, 1864-1865 .
PISSN	0013-4651
EISSN	1945-7111
関連情報 (isIdenticalTo)	出版社版DOI https://doi.org/10.1149/1.2114232

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