Estimating the dopant distribution in Ca-doped alpha-SiAlON: statistical HAADF-STEM analysis and large-scale atomic modeling

Sakaguchi, Norihito; Yamaki, Fuuta; Saito, Genki; Kunisada, Yuji

Estimating the dopant distribution in Ca-doped alpha-SiAlON: statistical HAADF-STEM analysis and large-scale atomic modeling

Sakaguchi, Norihito; Yamaki, Fuuta; Saito, Genki et al.

Microscopy, 2016, 65(5), 400-406

Permalink : https://hdl.handle.net/2115/67213

このアイテムのアクセス数:915件（2026-08-12 08:31 集計）

閲覧可能ファイル

ファイル	フォーマット	サイズ	閲覧回数	説明
JEM-HAADF-CaSiAlON_HUSCAP	pdf	4.18 MB	895

論文情報

ファイル出力 EndNote Basic出力 Mendeley出力

アクセス権	open access
URI	https://hdl.handle.net/2115/67213
タイトル	Estimating the dopant distribution in Ca-doped alpha-SiAlON: statistical HAADF-STEM analysis and large-scale atomic modeling
著者	Sakaguchi, Norihito ; Yamaki, Fuuta ; Saito, Genki ; Kunisada, Yuji
e-Rad_Researcher 70344489 著者名 Sakaguchi, Norihito
著者名 Yamaki, Fuuta
e-Rad_Researcher 00749278 著者名 Saito, Genki
e-Rad_Researcher 00591075 著者名 Kunisada, Yuji
言語	英語
キーワード	alpha-SiAlON
	HAADF-STEM
	multi-slice simulation
	electron channeling
	Monte Carlo simulation
	dopant distribution
発行日	2016-10
出版者	Oxford University Press
収録物名	Microscopy
巻(号)	65(5)
ページ	400-406
抄録	We investigated the dopant distribution in Ca-doped alpha-SiAlON by using high-angle annular dark-field scanning transmission electron microscopy and a multi-slice image simulation. Our results showed that the electron wave propagated by hopping to adjacent Si(Al) and N(O) columns. The image intensities of the Ca columns had wider dispersions than other columns. To estimate the Ca distribution in the bulk material, we performed a Monte Carlo atomic simulation of the alpha-SiAlON with Ca dopants. A model including a short-range Coulomb-like repulsive force between adjacent Ca atoms reproduced the dispersion of the intensity distribution of the Ca column in the experimental image.
資源タイプ	学術雑誌論文
出版タイプ	Accepted Manuscript
権利情報	This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Microscopy (2016) 65(5): 400-406. is available online at: http://dx.doi.org/10.1093/jmicro/dfw020.
PISSN	2050-5701
関連情報	PMID 27334599
関連情報 (isVersionOf)	出版社版DOI https://doi.org/10.1093/jmicro/dfw020