open access

https://hdl.handle.net/2115/80828

Electric field thermopower modulation analyses of the operation mechanism of transparent amorphous SnO2 thin-film transistor

英語

2020-04-06

American Institute of Physics (AIP)

Applied physics letters

116(14)

143503

Transparent amorphous oxide semiconductors (TAOSs) based transparent thin-film transistors (TTFTs) with high field effect mobility (mu(FE)) are essential for developing advanced flat panel displays. Among TAOSs, amorphous (a-) SnO2 has several advantages against current a-InGaZnO4 such as higher mu(FE) and being indium-free. Although a-SnO2 TTFT has been demonstrated several times, the operation mechanism has not been clarified thus far due to the strong gas sensing characteristics of SnO2. Here we clarify the operation mechanism of a-SnO2 TTFT by electric field thermopower modulation analyses. We prepared a bottom-gate top-contact type TTFT using 4.2-nm-thick a-SnO2 as the channel without any surface passivation. The effective thickness of the conducting channel was similar to 1.7 +/- 0.4nm in air and in vacuum, but a large threshold gate voltage shift occurred in different atmospheres; this is attributed to carrier depletion near at the top surface (similar to 2.5nm) of the a-SnO2 due to its interaction with the gas molecules and the resulting shift in the Fermi energy. The present results would provide a fundamental design concept to develop a-SnO2 TTFT.

学術雑誌論文

Version of Record

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Liang Dou-dou, Zhang Yu-qiao, Cho Hai Jun, Ohta Hiromichi. Electric field thermopower modulation analyses of the operation mechanism of transparent amorphous SnO2 thin-film transistor. Applied physics letters, 116, 143503 (2020) and may be found at https://doi.org/10.1063/5.0003153 .

0003-6951