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Fiber optical laser spot microscope: A new concept for photoelectrochemical characterization of semiconductor electrodes

Carlsson, Per; Holmström, Bertil; Uosaki, Kohei et al.

Applied Physics Letters, 1988, 53(11), 965-967

Permalink : https://hdl.handle.net/2115/20577

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アクセス権
open access
URI
https://hdl.handle.net/2115/20577
タイトル
Fiber optical laser spot microscope: A new concept for photoelectrochemical characterization of semiconductor electrodes
著者
Carlsson, Per ; Holmström, Bertil ; Uosaki, Kohei ; Kita, Hideaki
著者名
Carlsson, Per
著者名
Holmström, Bertil
著者名
Uosaki, Kohei
著者名
Kita, Hideaki
言語
英語
発行日
1988-09-12
出版者
American Institute of Physics
収録物名
Applied Physics Letters
巻(号)
53(11)
ページ
965-967
抄録
A fiber optical laser spot microscope, which allows the simultaneous measurements of photocurrent and reflected light intensity or the measurement of laser spot photocurrent under the illumination of other light sources, has been developed to study semiconductor/electrolyte interfaces. The capability of this microscope was demonstrated on as-cleaved and Pt-treated p-InSe. The Pt treatment increased the photocurrent and improved the lateral resolution due to the increase of surface reaction rate. The higher photocurrent was observed at the spot where the reflectivity was higher. This behavior is considered to be due to an uneven distribution of platinum. The laser spot photocurrent image under the illumination of other light sources provided useful information to clarify whether the rate was controlled by surface or bulk properties of InSe.
資源タイプ
学術雑誌論文
出版タイプ
Version of Record
権利情報
Copyright © 1988 American Institute of Physics
PISSN
0003-6951
EISSN
0003-6951
関連情報 (isIdenticalTo)
出版社版DOI
https://doi.org/10.1063/1.100083