低エネルギー電子回折イメージング

KAMIMURA, Osamu; Gohara, Kazutoshi

Nihon Kessho Gakkaishi, 2013, 55(6), 350-355

Permalink : https://hdl.handle.net/2115/54593

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ファイル	フォーマット	サイズ	閲覧回数	説明
Low-Energy Electron Diffractive Imaging	pdf	1.51 MB	988

アクセス権	open access
URI	https://hdl.handle.net/2115/54593
タイトル	低エネルギー電子回折イメージング
著者	著者名 KAMIMURA, Osamu
著者	e-Rad_Researcher 40153746 著者名 Gohara, Kazutoshi
言語	日本語
言語	英語
発行日	2013
収録物名	Nihon Kessho Gakkaishi
巻(号)	55(6)
ページ	350-355
抄録	Unlike conventional crystallography techniques, diffractive imaging becomes possible to analyze the specimen structure of non-crystalline materials. Combined low-energy electron beam with diffractive imaging, low-damage imaging technique has been developed for the analysis of light element material that is susceptible to damage due to beam. Here, it is described with respect to results of verification of low-energy electron diffractive imaging and atomic resolution imaging with carbon nanotubes as specimens. Furthermore, features of electron diffractive imaging in comparison with X-ray and our approach and efforts to date are described in this article.
資源タイプ	学術雑誌論文
出版タイプ	Version of Record
PISSN	0369-4585
EISSN	1884-5576
関連情報 (isIdenticalTo)	出版社版DOI https://doi.org/10.5940/jcrsj.55.350