In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents

Masuda, Takuya; Yoshikawa, Hideki; Noguchi, Hidenori; Kawasaki, Tadahiro; Kobata, Masaaki; Kobayashi, Keisuke; Uosaki, Kohei

In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents

Masuda, Takuya; Yoshikawa, Hideki; Noguchi, Hidenori et al.

Applied Physics Letters, 2013, 103(11), 111605

Permalink : https://hdl.handle.net/2115/59735

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アクセス権	open access
URI	https://hdl.handle.net/2115/59735
タイトル	In situ x-ray photoelectron spectroscopy for electrochemical reactions in ordinary solvents
著者	Masuda, Takuya ; Yoshikawa, Hideki ; Noguchi, Hidenori ; Kawasaki, Tadahiro ; Kobata, Masaaki ; Kobayashi, Keisuke ; Uosaki, Kohei
著者名 Masuda, Takuya
著者名 Yoshikawa, Hideki
著者名 Noguchi, Hidenori
著者名 Kawasaki, Tadahiro
著者名 Kobata, Masaaki
著者名 Kobayashi, Keisuke
e-Rad_Researcher 20133697 著者名 Uosaki, Kohei
言語	英語
発行日	2013-09-09
出版者	American Institute of Physics
収録物名	Applied Physics Letters
巻(号)	103(11)
ページ	111605
抄録	In situ electrochemical X-ray photoelectron spectroscopy (XPS) apparatus, which allows XPS at solid/liquid interfaces under potential control, was constructed utilizing a microcell with an ultra-thin Si membrane, which separates vacuum and a solution. Hard X-rays from a synchrotron source penetrate into the Si membrane surface exposed to the solution. Electrons emitted at the Si/solution interface can pass through the membrane and be analyzed by an analyzer placed in vacuum. Its operation was demonstrated for potential-induced Si oxide growth in water. Effect of potential and time on the thickness of Si and Si oxide layers was quantitatively determined at sub-nanometer resolution.
資源タイプ	学術雑誌論文
出版タイプ	Version of Record
権利情報	Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 103, 111605, 2013, and may be found at http://dx.doi.org/10.1063/1.4821180
PISSN	0003-6951
EISSN	1077-3118
関連情報 (isIdenticalTo)	出版社版DOI https://doi.org/10.1063/1.4821180