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Akazawa, Masamichi
;
Tamamura, Yuya
;
Nukariya, Takahide
;
Kubo, Kouta
;
Sato, Taketomo
;
Narita, Tetsuo
;
Kachi, Tetsu
Detection of defect levels in vicinity of Al₂O₃/p-type GaN interface using sub-bandgap-light-assisted capacitance-voltage method
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Journal of Applied Physics
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16-Nov-2022
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