An approach to nano-chemical analysis through NC-AFM technique


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/15417

Title:	An approach to nano-chemical analysis through NC-AFM technique
Authors:	Suzuki, S. Browse this author
	Koike, Y. Browse this author
	Fujikawa, K. Browse this author
	Matsudaira, N. Browse this author
	Nakamura, M. Browse this author
	Chun, W.-J. Browse this author
	Nomura, M. Browse this author
	Asakura, K. Browse this author →KAKEN DB
Keywords:	XANAM
	NC-AFM
	Oxide surface
Issue Date:	30-Sep-2006
Publisher:	Elsevier B.V.
Journal Title:	Catalysis Today
Volume:	117
Issue:	1-3
Start Page:	80
End Page:	83
Publisher DOI:	10.1016/j.cattod.2006.05.008
Abstract:	We have measured the NC-AFM frequency shift dependence on the X-ray energy around the Au L3 absorption edge energy. We found a peak in the frequency shift just above the Au region at the Au L3 absorption edge energy while we could not detect any peak in the frequency shift when the NC-AFM tip was placed above the Si regions. This novel phenomenon indicated that the combination of energy-variable X-rays and NC-AFM provides us a new way to nano level chemical mapping at surface. We briefly discussed some possible mechanisms.
Relation:	http://www.sciencedirect.com/science/journal/09205861
Type:	article (author version)
URI:	http://hdl.handle.net/2115/15417
Appears in Collections:	触媒科学研究所 (Institute for Catalysis) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 朝倉清高

OAI-PMH ( junii2 , jpcoar_1.0 )

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