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An approach to nano-chemical analysis through NC-AFM technique

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Title: An approach to nano-chemical analysis through NC-AFM technique
Authors: Suzuki, S. Browse this author
Koike, Y. Browse this author
Fujikawa, K. Browse this author
Matsudaira, N. Browse this author
Nakamura, M. Browse this author
Chun, W.-J. Browse this author
Nomura, M. Browse this author
Asakura, K. Browse this author →KAKEN DB
Keywords: XANAM
Oxide surface
Issue Date: 30-Sep-2006
Publisher: Elsevier B.V.
Journal Title: Catalysis Today
Volume: 117
Issue: 1-3
Start Page: 80
End Page: 83
Publisher DOI: 10.1016/j.cattod.2006.05.008
Abstract: We have measured the NC-AFM frequency shift dependence on the X-ray energy around the Au L3 absorption edge energy. We found a peak in the frequency shift just above the Au region at the Au L3 absorption edge energy while we could not detect any peak in the frequency shift when the NC-AFM tip was placed above the Si regions. This novel phenomenon indicated that the combination of energy-variable X-rays and NC-AFM provides us a new way to nano level chemical mapping at surface. We briefly discussed some possible mechanisms.
Type: article (author version)
Appears in Collections:触媒科学研究所 (Institute for Catalysis) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 朝倉 清高

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