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Heterogeneity-induced defect bifurcation and pulse dynamics for a three-component reaction-diffusion system.
Title: | Heterogeneity-induced defect bifurcation and pulse dynamics for a three-component reaction-diffusion system. |
Authors: | Yuan, Xiaohui Browse this author | Teramoto, Takashi Browse this author | Nishiura, Yasumasa Browse this author →KAKEN DB |
Issue Date: | 27-Mar-2007 |
Publisher: | American Physical Society |
Journal Title: | Physical Review E |
Volume: | 75 |
Issue: | 3 Pt 2 |
Start Page: | 036220 |
Publisher DOI: | 10.1103/PhysRevE.75.036220 |
PMID: | 17500782 |
Abstract: | We consider the dynamics when traveling pulses encounter heterogeneities in a three-component reaction diffusion system of one-activator–two-inhibitor type, which typically arises as a qualitative model of a gas-discharge system. We focused on the case where one of the kinetic coefficients changes similar to a smoothed step function, which is basic for more general heterogeneity as in periodic or random media. Since the heterogeneity is introduced to the kinetic part in an additive way, it causes the system to produce various types of localized structures smoothing the jump heterogeneity called the defects at the jump point, which makes a sharp contrast with the multiplicative heterogeneous case for the Gray-Scott model. The main issue is to study the collision dynamics between traveling pulses and defects, and show that their global bifurcation structure plays a key role in clarifying the underlying mechanism. Five outputs are observed after collisions including annihilation, rebound, and pinning. Unstable steady states are identified as separators between two different dynamic regimes: penetration and rebound, the role of which is very close to that of scattors arising in collision process. An organizing center producing the traveling pulses, defects, and scattors via unfolding with respect to the parameters is also presented. |
Rights: | Copyright © 2007 American Physical Society |
Relation: | http://www.aps.org/ |
Type: | article |
URI: | http://hdl.handle.net/2115/22083 |
Appears in Collections: | 電子科学研究所 (Research Institute for Electronic Science) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 西浦 廉政
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