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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.44 >

シリコンMOSダイオードの雑音とその原因に関する研究

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/40832

Title: シリコンMOSダイオードの雑音とその原因に関する研究
Other Titles: Studies on the Noise of Silicon MOS Diode and Its Origin
Authors: 前田, 正雄1 Browse this author
村野井, 徹夫2 Browse this author
Authors(alt): Maeda, Masao1
Muranoi, Tetsuo2
Issue Date: 5-Sep-1967
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 44
Start Page: 113
End Page: 137
Type: bulletin (article)
URI: http://hdl.handle.net/2115/40832
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.44

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