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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
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シリコンの複素屈折率について : サブミリ波より赤外線領域

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41394

Title: シリコンの複素屈折率について : サブミリ波より赤外線領域
Other Titles: On the Complex Refractive Index of Silicon : Wavelength from an Millimeter a Few Micronmeters
Authors: 小川, 吉彦1 Browse this author
Authors(alt): Ogawa, Yoshihiko1
Issue Date: 7-Dec-1976
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 82
Start Page: 47
End Page: 57
Type: bulletin (article)
URI: http://hdl.handle.net/2115/41394
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.82

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