導波光による薄膜の屈折率の測定


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41511

Title:	導波光による薄膜の屈折率の測定
Other Titles:	Measurements of Refractive-Index in Thin Films by Optical Waveguiding
Authors:	田中, 啓司¹ Browse this author →KAKEN DB
Authors(alt):	Tanaka, Keiji¹
Issue Date:	29-Nov-1978
Publisher:	北海道大学
Journal Title:	北海道大學工學部研究報告
Journal Title(alt):	Bulletin of the Faculty of Engineering, Hokkaido University
Volume:	90
Start Page:	99
End Page:	107
Type:	bulletin (article)
URI:	http://hdl.handle.net/2115/41511
Appears in Collections:	北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.90

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