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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.99 >

粒界面近傍における少数キャリアの拡散長と寿命の研究

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41624

Title: 粒界面近傍における少数キャリアの拡散長と寿命の研究
Other Titles: Investigasion of Minority Carrier Diffusion Length and Life Time in the Neighborhood of Grain Boundary
Authors: 小林, 広武1 Browse this author
小川, 吉彦2 Browse this author
黒部, 貞一3 Browse this author
Authors(alt): Kobayashi, Hiromu1
Ogawa, Yoshihiko2
Kurobe, Teiichi3
Issue Date: 11-Aug-1980
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 99
Start Page: 23
End Page: 33
Type: bulletin (article)
URI: http://hdl.handle.net/2115/41624
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.99

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