粒界面近傍における少数キャリアの拡散長と寿命の研究


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41624

Title:	粒界面近傍における少数キャリアの拡散長と寿命の研究
Other Titles:	Investigasion of Minority Carrier Diffusion Length and Life Time in the Neighborhood of Grain Boundary
Authors:	小林, 広武¹ Browse this author
	小川, 吉彦² Browse this author
	黒部, 貞一³ Browse this author
Authors(alt):	Kobayashi, Hiromu¹
	Ogawa, Yoshihiko²
	Kurobe, Teiichi³
Issue Date:	11-Aug-1980
Publisher:	北海道大学
Journal Title:	北海道大學工學部研究報告
Journal Title(alt):	Bulletin of the Faculty of Engineering, Hokkaido University
Volume:	99
Start Page:	23
End Page:	33
Type:	bulletin (article)
URI:	http://hdl.handle.net/2115/41624
Appears in Collections:	北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.99

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