検出面を傾けたエリプソ干渉法による結像特性の改善


Hokkaido University \| Library \| HUSCAP	Advanced Search		言語

	Home
	About HUSCAP
	Open Access Policy

	Browse by Author

Browse
	Communities & Collections

	Scholarly Journals
	Theses
	Doctoral Dissertations Listed by Graduate Schools
	Conference Procs.
	Events

	HUSCAP Senior (in Japanese)

	Societies

	Downloads (country)

For university staff
	How to post your papers to HUSCAP
	Publication of theses
	Helpline about theses publication

Open Archives Compliant

You can search our collection also at:
	Google
	Google Scholar
	CiNii
	IRDB
	OAIster
	NDLTD

Files in This Item:

116_61-70.pdf

1.13 MB

PDF

Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41810

Title:	検出面を傾けたエリプソ干渉法による結像特性の改善
Other Titles:	Improvement of Ellipso-Interferometric Image by Tilted Detecting Plane
Authors:	三島, 瑛人¹ Browse this author
Authors:	桜庭, 一郎² Browse this author
Authors(alt):	Mishima, Teruhito¹
Authors(alt):	Sakuraba, Ichiro²
Issue Date:	31-Oct-1983
Publisher:	北海道大学
Journal Title:	北海道大學工學部研究報告
Journal Title(alt):	Bulletin of the Faculty of Engineering, Hokkaido University
Volume:	116
Start Page:	61
End Page:	70
Type:	bulletin (article)
URI:	http://hdl.handle.net/2115/41810
Appears in Collections:	北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.116

OAI-PMH ( junii2 , jpcoar_1.0 )

- Hokkaido University