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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.116 >

検出面を傾けたエリプソ干渉法による結像特性の改善

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41810

Title: 検出面を傾けたエリプソ干渉法による結像特性の改善
Other Titles: Improvement of Ellipso-Interferometric Image by Tilted Detecting Plane
Authors: 三島, 瑛人1 Browse this author
桜庭, 一郎2 Browse this author
Authors(alt): Mishima, Teruhito1
Sakuraba, Ichiro2
Issue Date: 31-Oct-1983
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 116
Start Page: 61
End Page: 70
Type: bulletin (article)
URI: http://hdl.handle.net/2115/41810
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.116

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