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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.121 >
MOCVD成長によるアンドープGaAs中の電子トラップ
Title: | MOCVD成長によるアンドープGaAs中の電子トラップ |
Other Titles: | Deep Electron Traps in Undoped GaAs Grown by MOCVD |
Authors: | 橋詰, 保1 Browse this author →KAKEN DB | 池田, 英治2 Browse this author | 赤津, 祐史3 Browse this author | 大野, 英男4 Browse this author →KAKEN DB | 長谷川, 英機5 Browse this author →KAKEN DB |
Authors(alt): | Hashizume, Tamotsu1 | Ikeda, Eiji2 | Akatsu, Yuji3 | Ohno, Hideo4 | Hasegawa, Hideki5 |
Issue Date: | 31-May-1984 |
Publisher: | 北海道大学 |
Journal Title: | 北海道大學工學部研究報告 |
Journal Title(alt): | Bulletin of the Faculty of Engineering, Hokkaido University |
Volume: | 121 |
Start Page: | 23 |
End Page: | 31 |
Type: | bulletin (article) |
URI: | http://hdl.handle.net/2115/41875 |
Appears in Collections: | 北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.121
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