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Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.121 >
MOCVD成長によるアンドープGaAs中の電子トラップ
| Title: | MOCVD成長によるアンドープGaAs中の電子トラップ |
| Other Titles: | Deep Electron Traps in Undoped GaAs Grown by MOCVD |
| Authors: | 橋詰, 保1 Browse this author →KAKEN DB | | 池田, 英治2 Browse this author | | 赤津, 祐史3 Browse this author | | 大野, 英男4 Browse this author →KAKEN DB | | 長谷川, 英機5 Browse this author →KAKEN DB |
| Authors(alt): | Hashizume, Tamotsu1 | | Ikeda, Eiji2 | | Akatsu, Yuji3 | | Ohno, Hideo4 | | Hasegawa, Hideki5 |
| Issue Date: | 31-May-1984 |
| Publisher: | 北海道大学 |
| Journal Title: | 北海道大學工學部研究報告 |
| Journal Title(alt): | Bulletin of the Faculty of Engineering, Hokkaido University |
| Volume: | 121 |
| Start Page: | 23 |
| End Page: | 31 |
| Type: | bulletin (article) |
| URI: | http://hdl.handle.net/2115/41875 |
| Appears in Collections: | 北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.121
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