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北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.125 >

任意結晶格子を対象とするX線ラウエ写真の自動解析

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/41914

Title: 任意結晶格子を対象とするX線ラウエ写真の自動解析
Other Titles: Automatic Orientation Analysis of Crystallographic Axes of Arbitrary Lattice Using X-ray Laue Photograph
Authors: 植平, 一郎1 Browse this author
山田, 博憲2 Browse this author
渡辺, 英裕3 Browse this author
大場, 良次4 Browse this author
Authors(alt): Uehira, Ichiroh1
Yamada, Hironori2
Watanabe, Hidehiro3
Ohba, Ryoji4
Issue Date: 29-Mar-1985
Publisher: 北海道大学
Journal Title: 北海道大學工學部研究報告
Journal Title(alt): Bulletin of the Faculty of Engineering, Hokkaido University
Volume: 125
Start Page: 61
End Page: 68
Type: bulletin (article)
URI: http://hdl.handle.net/2115/41914
Appears in Collections:北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.125

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