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Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.136 >
光伝導法による半絶縁性InP基板の評価
| Title: | 光伝導法による半絶縁性InP基板の評価 |
| Other Titles: | Characterization of Semi-Insulating InP Substrates by Photo-Conductance Measurement |
| Authors: | 矢野, 仁之1 Browse this author | | 大野, 英男2 Browse this author | | 長谷川, 英機3 Browse this author | | 沢田, 孝幸4 Browse this author |
| Authors(alt): | Yano, Hitoshi1 | | Ohno, Hideo2 | | Hasegawa, Hideki3 | | Sawada, Takayuki4 |
| Issue Date: | 31-Jul-1987 |
| Publisher: | 北海道大学 |
| Journal Title: | 北海道大學工學部研究報告 |
| Journal Title(alt): | Bulletin of the Faculty of Engineering, Hokkaido University |
| Volume: | 136 |
| Start Page: | 77 |
| End Page: | 88 |
| Type: | bulletin (article) |
| URI: | http://hdl.handle.net/2115/42043 |
| Appears in Collections: | 北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.136
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