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Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University >
No.143 >
高分解能電子顕微鏡による化合物半導体/酸化絶縁膜界面構造の観察
| Title: | 高分解能電子顕微鏡による化合物半導体/酸化絶縁膜界面構造の観察 |
| Other Titles: | Observation of Interfaces of Compound Semiconductors by High Resolution Electron Microscope |
| Authors: | 高橋, 平七郎1 Browse this author | | 柴山, 環樹2 Browse this author | | 長谷川, 英樹3 Browse this author | | 大野, 英男4 Browse this author |
| Authors(alt): | Takahashi, Heishichiro1 | | Shibayama, Tamaki2 | | Hasegawa, Hideki3 | | Ohno, Hideo4 |
| Issue Date: | 30-Sep-1988 |
| Publisher: | 北海道大学 |
| Journal Title: | 北海道大學工學部研究報告 |
| Journal Title(alt): | Bulletin of the Faculty of Engineering, Hokkaido University |
| Volume: | 143 |
| Start Page: | 1 |
| End Page: | 10 |
| Type: | bulletin (article) |
| URI: | http://hdl.handle.net/2115/42147 |
| Appears in Collections: | 北海道大学工学部研究報告 = Bulletin of the Faculty of Engineering, Hokkaido University > No.143
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